WSEAS Transactions on Electronics
Print ISSN: 1109-9445, E-ISSN: 2415-1513
Volume 17, 2026
The Quality Imperative in High Volume Production of Electronic chips
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Abstract: Manufacturing process variation causes product inconsistency. In electronic parts production,
particularly wafer fabrication, the same concepts apply. In addition, the fact that a wafer contains a population
of individual electronic parts makes wafer processing an ideal candidate for the application of Statistical
Process Control (SPC) concepts and rules. This paper presents an industrial situation in electronic parts
manufacturing where process quality was greatly improved using SPC to study the causes of process variation.
This resulted in significant increase in production yield and a remarkable reduction in production cost.
Keywords:
Wafer Fabrication, SAW devices, Statistical Process Control (SPC), Mass Production Yield, etching, Center Frequency
Pages: 37-41
DOI: 10.37394/232017.2026.17.4