Abstract: The aim of this paper is to introduce the reliability methods in connection with lifetime determination and to design testing method for the prediction of the life of the micro switches. These products are subjected to complex stressing, for example, humidity, temperature, current load and so on. Therefore, the most important failure prediction methods, acceleration life testing methods with one, two or more variables have been introduced, as these methods are essential and necessary for reliability prediction.
DOI: *As the DOI is a unique identifier, it is already available in the pdf version. **The DOI link will be activated in the first midst of January 2026.
WSEAS Transactions on Circuits and Systems, ISSN / E-ISSN: 1109-2734 / 2224-266X, Volume 17, 2018, Art. #21
Vivien Sipkás, Gabriella Bognár, "Failure Prediction Models for Accelerated Life Tests," WSEAS Transactions on Circuits and Systems, vol. 17, pp. 173-179, 2018, DOI:
Vivien Sipkás, Gabriella Bognár. Failure Prediction Models for Accelerated Life Tests.
WSEAS Transactions on Circuits and Systems. 2018;17:173-179.